Summary
Overview
Work History
Education
Skills
Languages
Timeline
Generic
NATASHA ALIYA

NATASHA ALIYA

Munich

Summary

  • Product Development Engineer with several years of experience in proven ability to create System on Chip test programs for mobile phone and smartwatch platforms.
  • Optimisation of test time reduction and test cost based on stability and quality improvement.
  • Ability to handle several task forces successfully in several different projects.
  • Analyzing test measurement data for quality records.
  • Problem solving orientation, deep analytical thinking
  • Good interpersonal skill

Overview

17
17
years of professional experience

Work History

Senior Test Engineer

Qualcomm
09.2020 - Current
  • Leading and manage RFHTOL Qualification and ATE 93K projects and Laboratory activities.
  • Development and validation of test programs for RF modules, verification, analysis, and production test
  • Developing test program using Advantest V93000 ATE SMT 8 test system under program language Java
  • Developing Test program using AI capability for test time reduction purpose
  • Best innovation award for quarterly 2023 Qualcomm world wide regarding machine learning method for test program test time reduction
  • Power Amplifier test, Low Noise Amplifier test, Filter Test
  • Load board design, Load board GRR verification
  • Working using version control GIT
  • Trained junior testers in company standards, testing protocols and testing software.
  • Defined and tracked test results, defect counts and performance discrepancies.
  • Mentored junior test engineers, enhancing their skillsets and overall team performance.

Product Development Engineer

Intel Deutschland GmbH
06.2013 - 03.2020
  • Development and validation of test programs for System on Chip (SoC) for mobile phone and smartwatch platforms application for verification, analysis, characterization, and also production test
  • Developing test program using Advantest V93000 ATE SMT 7 test system under program language C/C++
  • Expertise: High Temperature Operating Lifetime (HTOL) test, SCAN test, DSCAN test, DRAM and LPDDR test, PCIe test, Performance test, Iddq measurement, DC test
  • Managing task forces and handling projects at the same time
  • Ensured optimization of test time reduction and test cost based on stability and quality improvement
  • Authoring device life time test program guideline
  • Creating Design for Test (DFT) pattern to be used in developing test program using VCS simulation
  • Investigating hardware defects by comprehensive debugging test program
  • Integrating different modules test for production test
  • Working using SCRUM agile method
  • Working using version control GIT, GERRIT and Jenkins
  • Coordinating with international team for development test program

Quality and Change Management

PT. Telekomunikasi Indonesia, Tbk.
03.2008 - 03.2009
  • Designing business flow procedure together with higher management level for every departments
  • Internal Audit based on ISO 9001 and reporting to higher management
  • Regular monitoring of the business flow in each department and readily making adaptations of changes based on needs

Education

Master of Science (MSc) - High Frequency Technique

Universität Bremen
10.2012

Bachelor of Science (BSc) - Electrical Engineering

University of Indonesia
07.2007

Skills

  • MS Office
  • Advantest 93000 Test System
  • C
  • C
  • Java
  • Matlab - Simulink
  • High Frequency Structural Simulator (HFSS)
  • Windows
  • Linux
  • GIT
  • GERRIT
  • SVN
  • Jenkins
  • SCRUM
  • Data Analysis
  • Test case design

Languages

English
German
Bahasa (Indonesia)

Timeline

Senior Test Engineer

Qualcomm
09.2020 - Current

Product Development Engineer

Intel Deutschland GmbH
06.2013 - 03.2020

Quality and Change Management

PT. Telekomunikasi Indonesia, Tbk.
03.2008 - 03.2009

Bachelor of Science (BSc) - Electrical Engineering

University of Indonesia

Master of Science (MSc) - High Frequency Technique

Universität Bremen
NATASHA ALIYA